Search

>>高级搜索

浏览历史

某厂计量处失效元件-CD54HC14F3A测试报告

英国ABI测试产品网 / 2011-11-04

SENTRY - Chip Report

Test Summary

Device:
008
Package:
14 pin DIL narrow
Scan Profile:
Low V Digital
Overall Result:
FAIL
Operator:
Administrator
Report Date:
18 October 2011

 

Pin Summary
Pin Diagram

SUCCESS Pins

Pin 7: 100 % Match

SUSPECT Pins

Pin 1: 71 % Match
Pin 2: 69 % Match
Pin 3: 71 % Match
Pin 4: 68 % Match
Pin 5: 71 % Match
Pin 6: 69 % Match
Pin 8: 69 % Match
Pin 9: 72 % Match
Pin 10: 68 % Match
Pin 11: 63 % Match
Pin 13: 72 % Match
Pin 14: 64 % Match

FAIL Pins

Pin 12: 3 % Match

 

Detailed Pin Analysis
Pin 7:
SUCCESS
Pin signature for 7
Pin 1:
SUSPECT
Pin signature for 1
Pin 2:
SUSPECT
Pin signature for 2
Pin 3:
SUSPECT
Pin signature for 3
Pin 4:
SUSPECT
Pin signature for 4
Pin 5:
SUSPECT
Pin signature for 5
Pin 6:
SUSPECT
Pin signature for 6
Pin 8:
SUSPECT
Pin signature for 8
Pin 9:
SUSPECT
Pin signature for 9
Pin 10:
SUSPECT
Pin signature for 10
Pin 11:
SUSPECT
Pin signature for 11
Pin 13:
SUSPECT
Pin signature for 13
Pin 14:
SUSPECT
Pin signature for 14
Pin 12:
FAIL
Pin signature for 12

下一篇:英国ABI-AT256测试案例-ST16C554良好器件测试报告

技术问答

暂时还没有任何用户评论

我要提问

用户名 匿名用户
电子邮件地址
评价等级
验证码 captcha
  Reset