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某研究中心测试案例-LM124J故障器件测试报告

英国ABI测试产品网 / 2012-05-14

 

Test Summary

Device: LM124J
Package: 14 pin DIL narrow
Scan Profile: Low V Analogue
Overall Result: FAIL
Operator: Administrator
Report Date: 20 March 2012
Pin Summary
Pin Diagram

SUCCESS Pins

Pin 1: 100 % Match
Pin 2: 100 % Match
Pin 4: 100 % Match
Pin 5: 100 % Match
Pin 6: 100 % Match
Pin 7: 100 % Match
Pin 9: 100 % Match
Pin 10: 100 % Match
Pin 11: 100 % Match
Pin 12: 100 % Match
Pin 13: 100 % Match
Pin 14: 100 % Match

FAIL Pins

Pin 3: 4 % Match
Pin 8: 17 % Match
Detailed Pin Analysis
Pin 1:
SUCCESS
Pin signature for 1
Pin 2:
SUCCESS
Pin signature for 2
Pin 4:
SUCCESS
Pin signature for 4
Pin 5:
SUCCESS
Pin signature for 5
Pin 6:
SUCCESS
Pin signature for 6
Pin 7:
SUCCESS
Pin signature for 7
Pin 9:
SUCCESS
Pin signature for 9
Pin 10:
SUCCESS
Pin signature for 10
Pin 11:
SUCCESS
Pin signature for 11
Pin 12:
SUCCESS
Pin signature for 12
Pin 13:
SUCCESS
Pin signature for 13
Pin 14:
SUCCESS
Pin signature for 14
Pin 3:
FAIL
Pin signature for 3
Pin 8:
FAIL
Pin signature for 8

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