Search

>>高级搜索

浏览历史

ADG506A数模混合集成电路好坏对比结果

北京金三航科技发展有限公司 / 2011-11-04

SENTRY - Chip Report

Test Summary

Device: AD506
Package: 28 pin DIL wide
Scan Profile: Normal Analogue
Overall Result: FAIL
Operator: Administrator
Report Date: 22 October 2011

Pin Summary
Pin Diagram

SUCCESS Pins
Pin 2: 100 % Match
Pin 3: 100 % Match
Pin 12: 100 % Match
Pin 13: 100 % Match

FAIL Pins
Pin 1: 49 % Match
Pin 4: 7 % Match
Pin 5: 5 % Match
Pin 6: 6 % Match
Pin 7: 7 % Match
Pin 8: 7 % Match
Pin 9: 7 % Match
Pin 10: 5 % Match
Pin 11: 6 % Match
Pin 14: 8 % Match
Pin 15: 6 % Match
Pin 16: 6 % Match
Pin 17: 6 % Match
Pin 18: 7 % Match
Pin 19: 7 % Match
Pin 20: 6 % Match
Pin 21: 7 % Match
Pin 22: 6 % Match
Pin 23: 6 % Match
Pin 24: 6 % Match
Pin 25: 6 % Match
Pin 26: 6 % Match
Pin 27: 61 % Match
Pin 28: 9 % Match
Detailed Pin Analysis
Pin 2:
SUCCESS
Pin signature for 2		 Pin 3:
SUCCESS
Pin signature for 3
Pin 12:
SUCCESS
Pin signature for 12		 Pin 13:
SUCCESS
Pin signature for 13
Pin 1:
FAIL
Pin signature for 1		 Pin 4:
FAIL
Pin signature for 4
Pin 5:
FAIL
Pin signature for 5		 Pin 6:
FAIL
Pin signature for 6
Pin 7:
FAIL
Pin signature for 7		 Pin 8:
FAIL
Pin signature for 8
Pin 9:
FAIL
Pin signature for 9		 Pin 10:
FAIL
Pin signature for 10
Pin 11:
FAIL
Pin signature for 11		 Pin 14:
FAIL
Pin signature for 14
Pin 15:
FAIL
Pin signature for 15		 Pin 16:
FAIL
Pin signature for 16
Pin 17:
FAIL
Pin signature for 17		 Pin 18:
FAIL
Pin signature for 18
Pin 19:
FAIL
Pin signature for 19		 Pin 20:
FAIL
Pin signature for 20
Pin 21:
FAIL
Pin signature for 21		 Pin 22:
FAIL
Pin signature for 22
Pin 23:
FAIL
Pin signature for 23		 Pin 24:
FAIL
Pin signature for 24
Pin 25:
FAIL
Pin signature for 25		 Pin 26:
FAIL
Pin signature for 26
Pin 27:
FAIL
Pin signature for 27		 Pin 28:
FAIL
Pin signature for 28

下一篇:深圳捷顺RC530测试报告
上一篇:英国ABI-AT256测试案例-ST16C554故障器件测试报告

技术问答

暂时还没有任何用户评论

我要提问

用户名 匿名用户
电子邮件地址
评价等级
验证码 captcha
  Reset