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深圳捷顺6LB184测试报告

北京金三航科技发展有限公司 / 2011-11-04

SENTRY - Chip Report

Test Summary

Device: 1509-50
Package: 8 pin DIL narrow
Scan Profile: Copy of Normal Digital
Overall Result: FAIL
Operator: Administrator
Report Date: 28 July 2011

 

Test Device Information
Capture Date: 28 July 2011
Operator: Administrator
Reference Picture:
Test Device Information
Comments:
6LB184
Comparison Reference Information
Capture Date: 28 July 2011
Operator: Administrator
Reference Picture:
Test Device Information
Comments:
6LB184

 

Pin Summary
Pin Diagram

SUCCESS Pins

Pin 5: 100 % Match
Pin 6: 92 % Match
Pin 7: 98 % Match
Pin 8: 100 % Match

SUSPECT Pins

Pin 1: 53 % Match
Pin 2: 63 % Match
Pin 3: 59 % Match
Pin 4: 60 % Match

 

Detailed Pin Analysis
Pin 5:
SUCCESS
Pin signature for 5
Pin 6:
SUCCESS
Pin signature for 6
Pin 7:
SUCCESS
Pin signature for 7
Pin 8:
SUCCESS
Pin signature for 8
Pin 1:
SUSPECT
Pin signature for 1
Pin 2:
SUSPECT
Pin signature for 2
Pin 3:
SUSPECT
Pin signature for 3
Pin 4:
SUSPECT
Pin signature for 4

 

下一篇:同步脉冲信号的应用,可以查看分立器件-三端器件
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